Thermo Fisher Scientific is set to unveil a new electron backscatter diffraction (EBSD) detector for electron microscopy. It is designed to help scientists, researchers and engineers quickly and accurately identify new materials and understand how the structure of a material affects its properties. The detector combines advanced optics with a new sensor that collects more than 2.2 megapixels, the largest number of pixels of any EBSD detector on the market.
The Thermo Scientific Lumis EBSD detector, which will make its debut at the Microscopy and Microanalysis 2018 meeting at the Baltimore Convention Center, incorporates a large-format CMOS sensor to enable higher sample throughput, higher resolution measurements and more precise phase identification, as compared to Thermo Fisher Scientific's previous-generation CCD detectors. The CMOS sensor provides exceptional sensitivity at high frame rates due to a high dynamic range, increased quantum efficiency and improved noise management.
Scientists and researchers in metallurgy, geophysics and other disciplines can use the Lumis EBSD detector to identify crystallographic phases and grain properties, as well as to monitor structural transformations in samples. The new detector is also designed to help microscopists better understand failure mechanisms.
Additional benefits of the Lumis EBSD detector include:
- Compatibility with Thermo Scientific Pathfinder 2.0 microanalysis software, including new indexing algorithms;
- High-speed data collection at several thousand frames per second; and
- Acquisition of patterns at probe currents below 10 pA for samples sensitive to microscope beam currents.
Click here to know more about Thermo Fisher at M&M 2018.