Astrella USP

Optical Amplifier by Coherent Corp.

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The Astrella USP from Coherent Corp. is an Ultrafast Ti:Sapphire Fiber Optic Amplifier that operates at a wavelength of 795 nm - 805 nm. It has a power stability of up to 0.5 rms and pulse energy above 5 mJ & 7 mJ (at 1 kHz) & 1.6 mJ (at 5 kHz). This linearly or horizontally polarized fiber optic amplifier has a TEM00 spatial mode and beam quality factor (M2) below 1.25. It has a beam diameter of 11 mm (at 1 kHz & 5 kHz) and pointing stability of up to 10 ╬╝rad. This fiber optic amplifier has a repetition rate of 1 kHz & 5 kHz and pulse duration of less than 35 fs (at FWHM).

The Astrella USP uses Revolution-50 & Revolution-65 pump lasers and Vitara-S, Vitara-T, or Vitara-T-HP seed lasers. This optical amplifier has a contrast ratio above 1000:1 (pre-pulse) & 100:1 (post-pulse) and is HASS (Highly Accelerated Stress Screening) verified. It has a hands-free Vitara oscillator and STAR regen amplifier. This fiber optic amplifier is available in a package that measures 1247 mm x 1213 mm x 262 mm and is ideal for time-resolved spectroscopy, multidimensional spectroscopy, THz spectroscopy, fs micromachining, surface SFG/SHG, stimulated Raman scattering, high harmonic generation & EUV spectroscopy applications.

Product Specifications

Product Details

  • Part Number
    Astrella USP
  • Manufacturer
    Coherent Corp.
  • Description
    795 nm - 805 nm, Ti:Sapphire Amplifier for EUV Spectroscopy Applications

General Parameters

  • Amplifier Type
    Ultrafast Amplifier
  • Beam Diameter
    11 mm
  • Beam Quality Factor (M2)
  • Output Type
  • Center Wavelength
    795 to 806 nm
  • Package Type
    Benchtop / Rackmount
  • Polarization
    Linear, Horizontal
  • Contrast Ratio
    >1000:1 (Pre), >100:1 (Post)
  • Output Power Stability
    <0.5 rms
  • Package
  • Pulse Energy
    >1.6 to 7 mJ
  • Pulse Width
    <35 fs
  • Repetition Rate
    1.5 kHz


  • Application
    Time-resolved Spectroscopy, Multidimensional Spectroscopy, THz Spectroscopy, fs Micromachining, Surface SFG/SHG, Stimulated Raman Scattering, High Harmonic Generation, EUV Spectroscopy

Technical Documents

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