SID4 eSWIR

Wavefront Sensor by PHASICS

Note: Your Quotation Request will be directed to PHASICS.

The SID4 eSWIR from PHASICS is an Extended SWIR Wavefront Sensor that operates at a wavelength of 0.9 μm - 2.35 μm. It has a phase spatial resolution of 120 μm and phase & intensity sampling of 80 x 64. This wavefront sensor has an aperture dimension of 9.6 mm x 7.68 mm and accuracy below 40 nm (RMS). It has a resolution (phase) of up to 6 nm (RMS) and real-time processing frequency of 10 Hz (full resolution). This wavefront sensor integrates PHASICS patented technology with a T2SL detector and provides both MTF & aberrations in one single shot. It can be controlled via a USB 2.0 interface and is available in a package that measures 90 mm x 115 mm x 120 mm. This wavefront sensor is ideal for free-space optical communication, defense & security, and aerospace applications.

Product Specifications

Product Details

  • Part Number
    SID4 eSWIR
  • Manufacturer
    PHASICS
  • Description
    0.9 µm - 2.35 µm, Extended SWIR Wavefront Sensor for Aerospace Applications

General Parameters

  • Type
    High Resolution, SWIR
  • Technology
    Quadriwave Lateral Shearing Interferometry (QWLSI), Lateral Shearing Interferometry
  • Optical Wavelength
    0.9 to 2.35 µm
  • Interface
    USB 2.0
  • Aperture Dimension
    9.6 mm x 7.68 mm
  • Measurement Frequency
    Real-time 10 Hz
  • Phase & Intensity Sampling
    80 x 64
  • Phase Resolution
    <6 nm RMS
  • Phase Spatial Resolution
    120 µm

Physical Properties

  • Dimensions
    90 x 115 x 120 mm
  • Weight
    1.8 kg

Applications

  • Application
    Free Space Optical Communication, Defense & Security, Aerospace

Technical Documents

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