Spectrometers - Solar Laser Systems

14 Spectrometers from Solar Laser Systems meet your specification.

Spectrometers from Solar Laser Systems are listed on GoPhotonics. We have compiled a list of Spectrometers from the Solar Laser Systems website/catalog and made their products searchable by specification. Use the filters to narrow down on products based on your requirements. Download datasheets and request quotes for products that you find interesting. Your inquiry will be directed to Solar Laser Systems and their distributors in your region.

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  • Manufacturer : Solar Laser Systems
Description: 190 nm to 1000 nm, Spectrometer for Laser Wavelength Control & Plasma Control Applications
Spectrometer Type:
Benchtop
Measuring Techniques:
Plasma Spectroscopy
Wavelength Range:
190 to 1000 nm
Spectral Resolution:
1 nm
Integration Time:
0.018 ms to 90 s (Exposure)
Spectrum Band:
UV
A/D Resolution:
14 Bit
more info
Description: Compact high-sensitivity Spectrometer for low light applications
Spectrometer Type:
Benchtop
Measuring Techniques:
Raman Spectroscopy, Fluorescence Spectroscopy
Wavelength Range:
200 nm, 1100 nm
Spectral Resolution:
0.22 to 2.3 nm
Integration Time:
8.3 ms to 5 s (Exposure time)
Spectrum Band:
UV
A/D Resolution:
16 Bit@250 kHz
Entrance Slit:
14 µm, 30 µm, 50 µm
more info
Description: 190 nm, 1100 nm wavelength, UV Spectrometer for Plasma Spectroscopy with 1 nm spectral resolution
Spectrometer Type:
Benchtop
Measuring Techniques:
Plasma Spectroscopy
Wavelength Range:
190 nm, 1100 nm
Spectral Resolution:
1 nm
Integration Time:
7.4 ms to 3 s (Exposure)
Spectrum Band:
UV
A/D Resolution:
14 Bit
more info
Description: Compact high-sensitivity Spectrometer for low light applications
Spectrometer Type:
Benchtop
Measuring Techniques:
Raman Spectroscopy, Fluorescence Spectroscopy
Wavelength Range:
200 nm, 1100 nm
Spectral Resolution:
0.22 to 2.3 nm
Integration Time:
8.2 ms to 2 s (Exposure time)
Spectrum Band:
UV
A/D Resolution:
16 Bit@125 kHz
Entrance Slit:
14 µm, 30 µm, 50 µm
more info
Description: Compact Spectrometer utilizing high sensitivity CMOS linear image sensors for low light applications
Spectrometer Type:
Benchtop
Measuring Techniques:
Raman Spectroscopy, Fluorescence Spectroscopy
Wavelength Range:
200 nm, 1000 nm
Spectral Resolution:
0.15 to 1.2 nm
Integration Time:
4 s (Exposure time)
Spectrum Band:
UV-VIS-NIR
A/D Resolution:
14 Bit
Entrance Slit:
14 µm, 30 µm, 50 µm
more info
Description: 200 nm, 1100 nm wavelength, UV Spectrometer for Plasma Spectroscopy with 1.5 nm spectral resolution
Spectrometer Type:
Benchtop
Measuring Techniques:
Plasma Spectroscopy
Wavelength Range:
200 nm, 1100 nm
Spectral Resolution:
1.5 nm
Integration Time:
0.018 ms to 90 s (Exposure)
Spectrum Band:
UV
A/D Resolution:
14 Bit
more info
Description: Compact Spectrometer utilizing high sensitivity CMOS linear image sensors for low light applications
Spectrometer Type:
Benchtop
Measuring Techniques:
Raman Spectroscopy, Fluorescence Spectroscopy
Wavelength Range:
200 nm, 1100 nm
Spectral Resolution:
0.15 to 1.2 nm
Integration Time:
90 s (Exposure time)
Spectrum Band:
UV-VIS-NIR
A/D Resolution:
14 Bit
Entrance Slit:
14 µm, 30 µm, 50 µm
more info
Description: Compact high-sensitivity Spectrometer for fluorescence, reflection, transmittance and photometric measurements
Spectrometer Type:
Benchtop
Measuring Techniques:
NIR Spectroscopy, IR Spectroscopy, Fluorescence Sp...
Wavelength Range:
780 nm, 1700 nm
Spectral Resolution:
1 to 4.6 nm
Integration Time:
8.2 ms to 0.7 s (Exposure time)
Spectrum Band:
NIR, IR
A/D Resolution:
16 Bit@125 kHz
Entrance Slit:
0.02 x 3 mm
more info
Description: 200 nm, 1100 nm wavelength, UV-VIS-NIR Spectrometer for Plasma Spectroscopy with 0.45 to 1.2 nm spectral resolution
Spectrometer Type:
Benchtop
Measuring Techniques:
Plasma Spectroscopy
Wavelength Range:
200 nm, 1100 nm
Spectral Resolution:
0.45 to 1.2 nm
Integration Time:
0.0083 ms to 3 s (Exposure time)
Spectrum Band:
UV-VIS-NIR
A/D Resolution:
16 Bit
Entrance Slit:
20 µm, 30 µm, 50 µm, 100 µm,
more info
Description: Compact Spectrometer utilizing high sensitivity CMOS linear image sensors for low light applications
Spectrometer Type:
Benchtop
Measuring Techniques:
Raman Spectroscopy, Fluorescence Spectroscopy
Wavelength Range:
200 nm, 1100 nm
Spectral Resolution:
0.15 to 1.2 nm
Integration Time:
90 s (Exposure time)
Spectrum Band:
UV-VIS-NIR
A/D Resolution:
14 Bit
Entrance Slit:
14 µm, 30 µm, 50 µm
more info
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  • Manufacturer : Solar Laser Systems

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