Pulse Testing of Laser Diodes
pulsed testing is commonly used to minimize power dissipation. However, several sources of error remain when pulse testing high power laser diodes, including problems with coupling high current pulses to the DUT, optical detector coupling, and both slow response and inaccuracy in the detector itself. This paper explores solutions to each of these problems that can deliver shorter test times, more accurate results, and lower reject rates. pulsed testing is essential because the devices have no temperature control circuitry at that point. Testing with DC would, either change their characteristics, or at worst, destroy them. Later on in production, when they've been assembled into modules with temperature controls, the devices can be DC tested and the results compared to those from the pulsed test.
