SPIE invites papers for the second annual Scanning Microscopies Conference. Submissions are encouraged from all areas of scanning microscopies, including optical, particle beam (ion and electron) and scanned probe, especially those in new growth areas. The Scanning Microscopies 2015 meeting gathers microscopists from all aspects of scanning microscopies in a single forum to discuss current research and new advancements in the field. Previous meetings have had a large forensics and food technology following, with various scanned microscopies being key investigative and research tools in micro- and nanotechnology.