Interferometers

64 Interferometers from 11 manufacturers listed on GoPhotonics

Find and compare Interferometers from the leading manufacturers. Filter results by wavelength, equipment type and other parameters to find the Interferometers that is right for you. Download Datasheets and Request Quotations.

Description: White Light Interferometer for Stable Thickness Measurement
Type:
White light interferometer
Measurement Type:
Thickness
Wavelength:
840 nm
Applications:
Thickness Measurement
Laser Source:
NIR-SLED, wavelength 840 nm
Measuring Length:
0.035 to 1.4 mm
Power Consumption:
10 W
Power Supply:
24 VDC ±15 %
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Description: 1.5 GHz Dual Band, Scanning Fabry-Perot Interferometer for Telecommunication Applications
Type:
Fabry-perot Interferometer
Measurement Type:
Wavelength
Free Spectral Range(FSR):
1.5 GHz
Wavelength:
290 to 355 nm, 520 to 545 nm
Frequency Resolution:
7.5 MHz
Applications:
Telecommunication, Spectral Analysis
Connector:
BNC, SMA
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Description: 1 GHz Scanning Fabry-Perot Interferometer from 380 - 430 nm
Type:
Fabry-perot Interferometer
Measurement Type:
Wavelength
Free Spectral Range(FSR):
1 GHz
Wavelength:
380 to 430 nm
Frequency Resolution:
2.5 MHz
Applications:
Telecommunication, Spectral Analysis
Connector:
FC/APC
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Description: Fizeau interferometer with High Resolution 1.3 MP Camera
Type:
Fizeau Interferometer
Measurement Type:
Shape
Object Shape:
2D, 3D
Applications:
Shape Measurement
Laser Source:
632.8 nm HeNe Laser
Power Supply:
110 to 240 V / 50-60 Hz
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Description: 100 ps Optical Delay Line Mach-Zehnder Interferometer
Type:
Mach-Zehnder Interferometer, Delay Line Interferom...
Free Spectral Range(FSR):
10 GHz to infinite
Optical Delay Range:
100 ps
Applications:
DPSK Demodulation
Connector:
FP/UPC, FC/APC, SC/PC, SC/APC, LC/PC, E2000/PC, E2...
Insertion Loss:
2.5 dB
Power Consumption:
0.001 to 0.5 W
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Description: 632.8 nm Red Helium-Neon Laser Interferometer for Dimension & Gage Block Measurements
Type:
Laser Interferometer
Measurement Type:
Thickness, Length
Wavelength:
632.8 nm
Applications:
Dimension Measurement, Gage Block Measurement
Measuring Length:
0 to 8 inch
Power Supply:
110 / 120 VAC 60 Hz (2 AMP), 220 / 240 VAC 50 Hz (...
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Description: 525 nm Cleave Check Interferometer for Surface Quality & Flatness Measurements
Measurement Type:
Shape, Angle
Wavelength:
525 nm (LED)
Measuring Angle:
4 Degree(3D), 8 Degree(2D)
Object Shape:
2D, 3D
Applications:
Precision cleaver manufacture, Cleaver maintenance...
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Description: 5 kHz, 3-Axis Compact Interferometer with Integrated Remote Sensors
Type:
Multiple Axis Interferometer
Object Shape:
2D, 3D
Applications:
Plane Mirror Measurement
Connector:
ST Connector
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Description: Industrial Grade Fizeau Interferometer for Surface Metrology
Type:
Fizeau Interferometer
Wavelength:
633 nm
Applications:
Surface Measurement
Laser Source:
High power stabilized HeNe
Output Power:
3 mW
Power Supply:
100 to 240 VAC, 50/60 Hz
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Description: 633 nm Dynamic Twyman-Green Interferometer for Vacuum & Environmental Chamber Testing
Type:
Twynman-Green Interferometer
Measurement Type:
Shape, Phase (wavefront), Reflectivity
Wavelength:
632.8 nm
Object Shape:
2D, 3D
Applications:
Optical Quality Control, Vacuum and Environmental ...
Laser Source:
Stabilized HeNe @ 632.8 nm
Output Power:
1.5 mW
Power Consumption:
750 W
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1 - 10 of 64 Interferometers

What is an Interferometer?

An interferometer is a precision measurement device that works based on interference, a phenomenon where two or more waves superimpose to produce an interference pattern in which the initial light intensities are redistributed and the resultant wave has higher, equal, or lower amplitudes. They are used in various industrial and academic applications like sensing, distance measurement, tracking & navigation, spectral analysis, and for surface quality analysis of various components and systems like lasers, optics in CD & DVD drivers, machine parts, etc.


Interferometers usually split a beam of light into two using a beamsplitter, a semitransparent mirror, and allow them to propagate through different paths as shown in the above figure. One of them is taken as the reference beam while the other is used for sampling purposes and is called the sensing beam. The sensing beam either is illuminated on a sample and gets reflected or passes through the sample. This reflected or transmitted beam will be modified from the incident sensing beam by the information from the sample. Superimposing it on the reference beam will result in an interference pattern that has all the necessary information about the sample. Hence, the required details of the sample under observation can be obtained by analyzing the pattern. This pattern is projected onto a screen, imaging detector, or camera.


The interference pattern formed is due to the superposition or overlap of both beams and it will have bright and dark areas or bands known as interference fringes. The bright fringes are regions of constructive interference and the dark fringes are regions of destructive interference.


Constructive interference takes place when the waves superimpose in phase, the crests and valleys of both waves match with each other, at that location resulting in a higher amplitude wave. Destructive interference occurs when the two superimposing waves are out-of-phase, i.e., the crest of one wave coincides with the valley of the other, resulting in a lower or zero amplitude wave. If the superposition of the two waves takes place with a phase difference that is in between, then it will result in an intensity depending on the degree of phase difference. These phase differences arise due to the interaction of the sample with the sensing beam.

If two conventionally used light sources, for example, lightbulbs, are placed close to each other, no interference patterns or fringes can be observed. Even though the emitted light waves superimposing at each location on a screen or a wall have certain phase differences from each other, the randomness in these instantaneous phase differences will make it difficult for human eyes or other detectors to perceive them or to adapt to rapid amplitude changes. Hence, an average illumination is being perceived. So, maintaining a constant phase difference between the sources is very important for observing or detecting interference patterns. This property is known as coherence. When the waves emitted by two sources have the same frequency and a constant phase difference, the sources are said to be coherent. Otherwise, they are known as incoherent sources.


Interference patterns can be observed on soap bubbles, oil films floating on water, etc. and the phenomenon of interference can be proved using Young’s double slit experiment where light waves from two secondary light sources (S2) derived from a point light source (S1) using small apertures produces interference pattern with bright and dark fringes on a screen (F) placed at a distance from them as shown in the above figure.

Modern interferometers use image sensors to capture the interference pattern and store them as interferograms. They can be easily analyzed using sophisticated software packages to extract necessary information and to re-create original images from them. 

There are different types of interferometers such as Michelson, Fabry-Perot, Fizeau, Mach-Zehnder, Sagnac, Twyman-Green interferometers, etc.

Interferometers in Astronomy

In astronomy, interferometry can be used to obtain high-resolution information about stars or other heavenly bodies. Signals from an assembly or array of multiple small telescopes or mirrors can be used to achieve a resolution equivalent to a large telescope that has the dimension of this assembly. A complex mirror system supports this assembly to bring out the light signals from each telescope and is superimposed to produce interference fringes from which high-quality, finely detailed images can be re-created or required information be obtained.

These interferometers are known as stellar interferometers and they use the property of spatial coherence. The spatial coherence of transversely separated sources decreases as the angle subtended by it increases. So, the angle subtended by the star on the earth can be determined by analyzing the spatial coherence in the interference fringes generated by the signals from two or more transversely separated telescopes. The resolution in angle obtained from spatial coherence increases as the separation of these telescopes increases. Combining details from other sources with the result of stellar interferometry, diameter, distance, surface intensity distribution, etc. can be deduced for the given star.

Interferometers in the Medical field

Interferometers can also be incorporated into optical fiber systems that are used in medical instruments like endoscopes, needles, and catheters which allow in vivo study of biological cells, tissues, and internal organs. They can perform in vivo medical imaging, diagnosis, monitoring, and minimally invasive surgeries. They use the advancements in the knowledge of the interaction between light and biomaterials.

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