Semiconsoft, Inc was founded in 2001 with the mission to make data analysis of thin film thickness measurement and n&k easy and transparent to users. TFCompanion software enabled engineers to import ellipsometry, reflectance, transmittance and imaging ellipsometry data and quickly analyze it. TFCompanion was the only software that supported import of measurement data from a wide range of thin film measurement systems. Consistent analysis of the data helped in qualification of the systems.
400 nm - 1000 nm, Reflectometer for Thickness Measurement Applications
Oct 31, 2025