The IMS5400-TH45 from Micro-Epsilon is a White Light Interferometer that is designed for industrial thickness measurement. It can measure a thickness of 0.035-1.4 mm from a distance of up to 45 mm and at a continuously adjustable rate of 100 Hz to 6 kHz. This interferometer has a NIR-SLED light source of wavelength 840 nm that can measure even the thickness of optically non-dense objects such as anti-reflective coated glass.

The IMS5400-TH45 provides the decisive advantage of distance-independent measurement which results in a stable nanometer-accurate thickness value. The target can move within its measuring range without influencing the accuracy. This interferometer's thickness measuring range also allows the measurement of thin layers, flat glass, and films. It requires a DC supply of 24 V and consumes 10 W of power. This interferometer is available in an aluminum housing that measures Φ10 x 55 mm.