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Xenics, a leading developer and manufacturer of advanced infrared detectors, cameras and customized imaging solutions from the SWIR to the LWIR realm, is exhibiting its latest developments at the on-going Laser World of Photonics 2017 in Munich from June 26 - 29. The company has also announced two latest additions to its XLIN detector series, the XLIN-FC SQ series and the XLIN-FC R series. Both are ultra-high speed SWIR line scan detectors, suitable for applications in machine vision and spectroscopy.
XLIN-FC series
The XLIN-FC series are the latest linescan SWIR InGaAs detectors from Xenics, using flip-chip (FC) type hybridization. It will be available in two high speed detector types, the XLIN‐FC R with rectangular pixels for spectroscopy applications, and the XLIN‐FC SQ with square pixels for machine vision. The detectors operate in low illumination conditions thanks to a new high-sensitivity ROIC (read-out integrated circuit) developed in-house by Xenics. The InGaAs photodetectors also exhibit a high QE in the 900 to 1700 nm wavelength range. The detectors come in different resolutions: 512, 1024 or 2048 pixels and fast in-line inspection is guaranteed with the world-record line rate of up to 400 kHz, for all three resolutions. Various gain settings are available to optimize performance (sensitivity and dynamic range) in a specific application.
XLIN-FC SQ (Square series)
For all three resolution versions, the XLIN-FC SQ consists of square pixels with a 12.5 µm pixel pitch and height. Even in the 2048 pixel version, the total array length does not exceed 25.6 mm.
The XLIN-FC SQ detectors are suitable for applications such as food sorting, waste recycling, remote sensing and (micro-)crack detection in solar cell wafers or ingots.
XLIN-FC R (Rectangular series)
The XLIN-FC R series consists of rectangular pixels with a pitch of 12.5 µm, and a pixel height for 250 µm, for all three resolution versions. Same as for the XLIN-FC SQ, even in the 2048 pixel version, the total array length does not exceed 25.6 mm. It is suitable for SWIR spectroscopy applications in general. Especially, medical OCT (optical coherence tomography) systems can benefit greatly from high speed linescan detectors in the SWIR wavelength range. The high resolution of the XLIN-FC R extends the application area of OCT towards higher spatial resolution, providing detailed imaging for medical applications and analysis.