Find High-Performance Interferometers for Optical Characterization and Industrial Applications

Posted  by GoPhotonics

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GoPhotonics features a versatile range of Interferometers designed to support precision optical metrology, spectroscopy, laser diagnostics, and industrial measurement applications. Spanning Fabry-Pérot, Fizeau, Twyman-Green, and white-light interferometer configurations, the featured systems address measurement requirements across visible, broadband, and ultrafast spectral regions. Engineered for accuracy and repeatability, these interferometers incorporate features such as high spectral resolution, vibration-insensitive operation, motorized controls, automated analysis, high-speed imaging, and compact system architectures to support stable optical characterization in laboratory and industrial environments.

SFPI-500A(DP): Fabry-Pérot Interferometer for Continuous-Wave Laser Analysis

The SFPI-500A(DP) from LD-PD is a Fabry-Pérot interferometer designed to examine the fine spectral structure of continuous-wave lasers. The scanning interferometer operates across a spectral response range of 535 nm to 820 nm and provides a free spectral range of 1.5 GHz with a resolution of less than 7.5 MHz. It incorporates a confocal Fabry-Pérot optical cavity with a length of 50 mm and a cavity finesse of 250, enabling detailed spectral analysis of laser characteristics. Offered in a compact form factor measuring Φ50.8 mm x 85 mm, the interferometer is suited for applications involving fine spectral characterization of CW laser sources.

X-fiz 100 ST: Fizeau Interferometer for Optical Measurement Applications

The X-fiz 100 ST from XONOX Technology is a Fizeau interferometer designed for precision measurement applications at a 633 nm operating wavelength. It features a 4-inch Fizeau aperture and incorporates the X fringe ST static fringe analyzing system for interferometric evaluation. The system includes a low-distortion imaging system with motorized pupil plane focus control and an optical axis height of 131 mm. Equipped with a 5 MP, 8-bit monochrome CMOS sensor, the interferometer includes a Dell PC with a 24-inch touchscreen and 19-inch live image display, supports Windows 10, and is compatible with X fringe2 PS and X fringe ST software. The system can be controlled through a USB 3.0 interface and is supplied in a package measuring 310 mm x 285 mm x 530 mm for optical measurement tasks.

Also Read: What is a Mach-Zehnder Interferometer?

GEMINI: Broadband Interferometer for Time- and Frequency-Resolved Spectroscopy

The GEMINI from NIREOS SRL is an interferometer designed for broadband optical measurements across a spectral range of 250 nm to 4200 nm. The system provides a maximum optical delay from -100 fs to 2000 fs with delay stability of less than 1 x 10-18 s, enabling precise control in ultrafast optical experiments. It incorporates a user-selectable scan range and is designed to be insensitive to vibrations for stable operation. Available in a compact module measuring 176 mm x 44 mm x 54.5 mm, the interferometer is intended for time- and frequency-resolved fluorescence, coherent Raman spectroscopy, pump-probe spectroscopy, pulse-pair generation, single-molecule studies, two-dimensional spectroscopy, and interferometry applications.

PhaseCam 6110: Dynamic Twyman-Green Interferometer for Large Optics Testing

The PhaseCam 6110 from 4D Technology is a dynamic Twyman-Green interferometer operating at a 632.8 nm wavelength with a 1.5 mW He-Ne laser source and a 7 mm beam diameter (FWHM). The circularly polarized system achieves an acquisition rate greater than 15 fps with a minimum exposure time of 30 µs, while supporting sample reflectivity from 1% to 100% and repeatability below 0.0005 RMS. It includes a 4 MP, 12-bit camera, motorized controls for focus, reference beam block, aperture block, and contrast adjustment, and vibration-insensitive operation for stable interferometric measurements. Supporting a maximum cavity length above 100 m, the interferometer is compatible with Windows 10 and is suited for meter-class telescope optics, large imaging system alignment, vacuum or environmental chamber testing, production floor quality control, and computer-generated hologram testing.

IMS5200-TH26: White Light Interferometer for Inline Thickness Measurement

The IMS5200-TH26 from Micro-Epsilon is a white light interferometer designed for industrial inline thickness measurement applications. It provides a resolution of less than 1 nm, linearity below ±100 nm, and a continuously adjustable measuring rate from 100 Hz to 24 kHz. The system uses an internal white LED light source to measure a single transparent layer with a thickness range of 1 µm to 100 µm and a working distance of 26 mm ± 2 mm. It features a 55 µm light spot diameter, 16-bit output format, and supports communication through Ethernet, EtherCAT, RS422, PROFINET, and EtherNet/IP interfaces. Available in a stainless-steel sensor package measuring Ø10 mm x 66 mm, the interferometer includes IP65 protection for the sensor and optional ultra-high vacuum compatibility for demanding industrial environments.

With capabilities ranging from ultrafast spectroscopy and laser spectral characterization to wavefront analysis, optical metrology, and industrial inline inspection, GoPhotonics’ interferometer lineup provides high-precision measurement solutions for scientific and industrial photonics. Combining stable optical performance, compact integration, and advanced measurement functionality, these interferometers support next-generation optical testing, diagnostics, and precision manufacturing workflows.

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