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MKS Instruments has announced new additions to the Ophir NanoScan 2s line of high power, scanning slit laser beam profilers. NanoScan products are NIST-calibrated profilers that instantly measure beam position and size with submicron precision for CW and kilohertz pulsed lasers. The profilers offer a choice of silicon, germanium, or pyroelectric detectors, which allows profiling lasers of any wavelength, from UV to far infrared, to 100µm and beyond.
The new Ophir NanoScan 2s Pyro/9/5-MIR is a lower cost profiler designed to measure mid IR wavelengths from 900nm to 5µm. This joins the rest of the NanoScan 2s family of products, which now includes:
A special software offer is also in place through the end of 2018. Users can upgrade from NanoScan Standard to NanoScan Professional software for a nominal charge. NanoScan software includes an extensive set of NIST-traceable ISO measurements for beam width and roundness, beam position, and M2. The Professional version adds an ActiveX automation interface for sharing data with other applications, such as LabVIEW or Microsoft Excel.
According to Reuven Silverman, General Manager at Ophir, NanoScan scanning slit profilers are designed to measure smaller beams than is possible with CCD camera technology. They are ideally suited for very small beam diameters and are often used by manufacturers of laser beam sources, such as for medical engineering. Ophir continues to invest in scanning slit technology and has expanded its offerings to include lower cost alternatives for measuring beams in the near IR to mid IR range, and to accommodate beam widths from as small as 20µm up to 6mm.
The NanoScan 2s profilers use moving slits – an ISO standard scanning aperture technique – to measure beam sizes from µm to mm at beam powers from µW to kW. The natural attenuation provided by the slit allows the measurement of many beams with little or no additional attenuation required. A built-in digital controller provides 16-bit digitization of the signal for high dynamic range up to 35 dB power; this makes it possible to measure beam size and beam pointing with 3-sigma precision to several hundred nanometers. The silicon or germanium detector-based NanoScan 2s’s include an integrated 200 mW power meter that displays both total power and individual power in each of the beams being measured.
