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Changes of high-power laser diode characteristics with stress-induced reduction of the degree of polarization

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Changes of high-power laser diode characteristics with stress-induced reduction of the degree of polarization

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  • Author: A. Maina, C. Coriasso, S. Codato, R. Paoletti
Beyond the straightforward detrimental effect on the multi-emitter total power, being the DOP a main factor of the overall yield, see Fig. 1(a), the DOP reduction implies less evident but important effects on the overall laser characteristics, which are the focus of this paper. Both the L-I characteristic (threshold current and slope efficiency) and the beam properties (near-, far-field) are indeed significantly affected by DOP reduction and the analysis of the relevant changes could be of general interest for investigation of stress-induced photo-elastic effect on laser diodes.

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