1.  Home
  2. Whitepapers
  3. Z-Scan for the Characterization of Transparent Optical Materials

Z-Scan for the Characterization of Transparent Optical Materials

Download Whitepaper

Z-Scan for the Characterization of Transparent Optical Materials

Download Whitepaper
Reliable methods for determining the nonlinear optical properties of materials (i.e. nonlinear absorption and nonlinear refraction) have been developed for wide ranging applications such as optical limiting1 , multi-photon polymerization2 as well as optical switching3 . Of these methods, “z-scan”, developed by Eric Van Stryland1,4, remains the standard technique. The z-scan technique is performed by translating a sample through the beam waist of a focused beam and then measuring the power transmitted through the sample. Z-scan has many possible configurations (e.g. “EZ-Scan5 ”, “White Light z-scan6 ”, “Excite-Probe z-scan7 ”).

Download Whitepaper Now