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Time-Dependent Capacitance Drift of X7R MLCCs Under Exposure to a Constant DC Bias Voltage

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Time-Dependent Capacitance Drift of X7R MLCCs Under Exposure to a Constant DC Bias Voltage

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  • Author: Paul Coppens, Eli Bershadsky, John Rogers, and Brian Ward
Vishay and three other manufacturers’ ML CCs were subjected to 40 % and 100 % of their rated voltage for DC bias aging analysis, which spanned over 1000 hours. After periodic interv als of time, the capacitance was measured on all samples with the same DC bias voltage level applied. Results confirmed that prolonged exposure of X7R capacitors to a DC bias voltage leads to a capacitance decrease that is much stronger than th e natural drift due to aging. All competitors’ capacitors show a greater rate of capacitance loss over time compared to Vishay capacitors. Beyond 1000 hours, the Vishay capacitors have the highest remaining capacitance. It was also observed that once bias is removed, Vishay’s capa citance recovers much quicker than competing parts.

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