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LTE Performance through Early Testing and Faster Mean Time to Identify Failure

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LTE Performance through Early Testing and Faster Mean Time to Identify Failure

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  • Author: Jorma Axelsson, Kader Khan
This white paper looks at how-by reducing mean time to identify failures (MTIF)-test solutions generate savings for both MNOs and NEMs, while fostering stellar LTE network and device performance. For mobile network operators (MNOs) and network equipment manufacturers (NEMs) deploying or developing 4G LTE mobile technology, the timely identifi cation of failures-achieved through comprehensive testing-is a signifi cant opportunity to cut costs, while still achieving the highest levels of quality, service and support.

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