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100G DP-QPSK Transmitters: using Time-Resolved EVM and Masks for Rapid Pass/Fail Validation in Manufacturing

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100G DP-QPSK Transmitters: using Time-Resolved EVM and Masks for Rapid Pass/Fail Validation in Manufacturing

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  • Author: François Robitaille, Mathias Westlund, Henrik Sunnerud, Mats Skold
Compliance testing of optical transmitters using on/off keying (OOK) modulation at 10G or 40G is well known and precisely defi ned in ITU-T, IEC and IEEE standards and recommendations. Since 100GE client-side transponders also employ OOK modulation, albeit at a different bit rate, the IEEE has simply adapted established 10G compliance masks and testing procedures to these new rates. However, it is not so straightforward for 100GE line-side transponders, since a new “multilevel” coherent modulation scheme, DP-QPSK, is now being used, making “traditional” approaches (i.e., approaches applied to signals carrying one bit per symbol) no longer applicable.

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