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PDL Measurement using the CTP10 Platform and CT440-PDL

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PDL Measurement using the CTP10 Platform and CT440-PDL

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This application note describes how swept polarization dependent loss (PDL) measurements can be performed using either a CTP10 test platform or a CT440-PDL component tester. In the configuration shown in the figure below, the IL PDL OPM2 module of the CTP10 enables both the generation of 4 or 6 states of polarization (SOP) required for the Mueller analysis in the PDL determination and the measurement of the insertion loss (IL) of the device under test (DUT).

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