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OFDR measurement using the CTP10 test platform

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OFDR measurement using the CTP10 test platform

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This application note describes how optical frequency domain reflectometry (OFDR) measurements can be performed using the CTP10 component test platform. OFDR is primarily used to create a map of reflections within the optical path of a device under test (DUT), usually as a function of distance. OFDR measurement relies on a sweeping tunable laser and a high-speed power meter to acquire an interference pattern as a function of optical frequency.

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