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Swept IL Measurement: Key Notions and Future-Proof Solutions

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Swept IL Measurement: Key Notions and Future-Proof Solutions

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  • Author: François Couny
Passive components are at the heart of any network-from longhaul to access-and must meet increasingly stringent requirements to accommodate the bandwidth explosion triggered by the deployment of 5G and FTTx. So, component manufacturers, system integrators and operators must have a way to quickly and reliably characterize optical components. Optical characterization usually starts with measurement of the insertion loss (IL) as a function of wavelength for the device under test (DUT). This provides critical information, such as the minimum loss. For wavelength-dependent filters (multiplexers/demultiplexers, wavelength selective switches, etc.), additional parameters such as central wavelength, width and isolation are equally important characteristics derived from the insertion loss measurement.

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