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Fast and Easy Programming with the IQS-500 Intelligent Test System: PDL as a Function of Wavelength

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Fast and Easy Programming with the IQS-500 Intelligent Test System: PDL as a Function of Wavelength

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  • Author: Maire-Helene, Leo Gagne, Rick Hapanowicz
XFO knows that you are expecting a reliable and powerful solution that delivers a flexible environment in which it is easy to integrate a great variety of test instruments. That is why EXFO has developed its new IQS-500 Intelligent Test System with automation in mind. This technical note is intended to help you in that task by giving a typical example of a Microsoft Visual Basic program, designed to control EXFO’s tunable laser source and PDL meter in order to measure a component’s polarization-dependent loss (PDL) as a function of wavelength.

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