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DFL-5720 Digital Frequency-Locking System: Simplifying Wavelength-Locker Testing

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DFL-5720 Digital Frequency-Locking System: Simplifying Wavelength-Locker Testing

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  • Author: Olivier Plomteux
This application note explains how the use of EXFO’s DFL-5720 Digital Frequency-Locking System can simplify the implementation of a closed-loop process required for blocking a test laser frequency to perform alignments, tests and stability verification. Tunable laser diodes (LDs), whether widely or narrowly tunable, are being deployed and will surely replace the fixed-wavelength DFB-type LDs that have been used for years in WDM links of few kilometers and beyond. The use of tunable devices for reducing inventory is the prime interest at the present time, but they also serve as an agile backup in case of an ITU grid transmitter failure. In the future, the availability of all-optical switching will most probably cause these devices to be widely used.

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