1.  Home
  2. Whitepapers
  3. Alluxa Introduces Helix™ Spectral Analysis System for Measuring High-Performance Thin-Film Optical Filters

Alluxa Introduces Helix™ Spectral Analysis System for Measuring High-Performance Thin-Film Optical Filters

Download Whitepaper

Alluxa Introduces Helix™ Spectral Analysis System for Measuring High-Performance Thin-Film Optical Filters

Download Whitepaper
  • Author: Alannah Johansen, Amber Czajkowski, Niels Cooper, Mike Scobey, Peter Egerton, Rance Fortenberry
The HELIX Spectral Analysis System has redefined measurement capabilities of high performance thin-film optical filters. HELIX is an instrument designed and developed by Alluxa Engineering staff to address the limitations of most commercially available spectrophotometers. The system’s capabilities are four-fold: it is able to track filter edges to OD7 (-70 dB), evaluate blocking to OD9 (-90 dB), resolve edges as steep as 0.4% relative to edge wavelength from 90% transmission to OD7, and resolve passbands that are as narrow as 0.1 nm at full width half maximum (FWHM).

Download Whitepaper Now