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Refracted Near-Field Measurements Of Refractive Index and Geometry of Silica-on-silicon Integrated Optical Waveguides

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Refracted Near-Field Measurements Of Refractive Index and Geometry of Silica-on-silicon Integrated Optical Waveguides

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  • Author: Philippe Oberson, Bernard Gisin, Bruno Huttner, Nicolas Gisin
Integrated optics on silicon has reached a high level of performance in passive optical components and circuits,1–5 with applications for telecommunications as well as for sensors. The basic physical characteristic of optical waveguides is given by the distribution of the refractive index. From this distribution all local parameters can be computed, such as the mode profile that determines the coupling losses. Measurement of the refractive-index profiles also provides useful quality control during the development and production of the components. The refracted near-field ~RNF! technique is the most advanced technique used to measure refractive-index profiles of optical fibers6,7 and glass-integrated optical waveguides.

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