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Raman Mapping of Layer Number, Strain, and Structural Defects in Graphene

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Raman Mapping of Layer Number, Strain, and Structural Defects in Graphene

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  • Author: Matthew Berry
The Edinburgh Instruments RM5 Confocal Raman Microscope is ideal for analysing graphene. Raman mapping reveals information on graphene’s structural and electronic properties. It can map the location of structural defects, strain, doping, and layer stacking using the relative intensities and positions of the Raman bands in the graphene spectrum. In this Application Note, the capability of the RM5 and Ramacle® software for graphene analysis is demonstrated by mapping the layer number, strain, and defects on graphene films.

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