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Enhanced Detection of Trace Gases with V-lens™ Ion Optics Technology

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Enhanced Detection of Trace Gases with V-lens™ Ion Optics Technology

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  • Author: Scott Brereton, Jim Blessing, Jonathan Leslie, Alistair Wallace
The most common instrument used for detecting trace contamination in vacuum systems is the Quadrupole Mass Spectrometer (QMS, Figure 1). In a conventional QMS, a line of sight exists from the ion source through the mass filter. Much of the baseline noise in the QMS is due to species that have enough energy to maintain a near-linear trajectory through the quadrupole without being filtered. V-lens™ technology is a patented, ion optic system capable of double-focusing ions and blocking of neutrals. This ion optic system steers and focuses the ion beam prior to its entrance into the quadrupole mass filter; thus optimizing the transmission of ions, whilst the deflector lens eliminates the line of sight between the ion source and the quadrupole.

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