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Measuring Challenges of Wide and Divergent Beams

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Measuring Challenges of Wide and Divergent Beams

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  • Author: Yoni Groisman, Karol Sanilevitch, Roei Yiftah, Dr. Simon Rankel
VCSELs, LEDs, edge emitting, and fiber lasers are used in many sensitive applications within fast-growing markets. To guarantee the high quality of the devices, it is essential to analyze the beam profile, but those wide, divergent beams place specific requirements on the measurement system. On the one hand, the apertures of conventional beam profilers are too small to collect the entire spot of large or divergent light sources. On the other hand, diverging beams cannot be accurately measured with regular detectors because the quantum efficiency of the detector is highly dependent on the angle of incidence.

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