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Multiple Beam Analysis with the NanoScan

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Multiple Beam Analysis with the NanoScan

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Aligning the output of laser diode or fiber optic arrays can be quite challenging. One of the lesser known features of the Photon NanoScan slit profilers is the multibeam analysis capability. The NanoScan software allows the characterization of up to 16 simultaneous beams entering the aperture, allowing the user to examine and evaluate various standard beam parameters displayed within the automatically-determined or user-defined regions-of-interest (ROI) on any or all beams captured by NanoScan. This unique control and selection feature gives the user flexibility to single out one beam or to view the entire beam set. Multiple beam data is displayed on the screen and can be isolated in contiguous beam sections as they are collected.

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