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Improve Throughput and Maintain Performance with the ILX Lightwave Integrated Carrier Solution (ICS)

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Improve Throughput and Maintain Performance with the ILX Lightwave Integrated Carrier Solution (ICS)

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A primary and valid concern when using high volume laser diode test systems to test and burn-in numerous devices is device handling. Manually loading and unloading multiple devices into a test fixture is not only cumbersome, but also increases the potential of device damage and can greatly inflate overall test times. In addition, thermal and electrical results can be compromised when devices are moved amongst various test stages, each with its own unique interface to the devices under test (DUT).

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