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Optical Arbitrary Waveform Measurement (OAWM) on the Silicon Photonic Platform

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Optical Arbitrary Waveform Measurement (OAWM) on the Silicon Photonic Platform

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  • Author: Dengyang Fang, Andrea Zazzi, Juliana Müller, Daniel Drayß, Christoph Füllner, Pablo Marin-Palomo, Ali Tabatabaei Mashayekh, Arka Dipta Das, Maxim Weizel, Sergiy Gudyriev, Wolfgang Freude, Sebastian Randel, Christoph Scheytt, Jeremy Witzens, and Christian
We demonstrate optical arbitrary waveform measurement (OAWM) using a silicon pho-tonic spectral slicer. Exploiting maximal-ratio combining (MRC), we demonstrate the viability of the scheme by reconstructing 100-GBd 64QAM signals with high quality.

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