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Advancing Ultrafast Photoacoustic Spectroscopy for Thin Film Metrology

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Advancing Ultrafast Photoacoustic Spectroscopy for Thin Film Metrology

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Ultrafast Photoacousticcharacterization is a spectroscopictechnique that exploitsthe photoacoustic effect and ultra-fast laser technologyto study materials at the nanometerscale. A Newportcustomer in France is using thistechnique to provide metrologyservicesto thin film researchersin the scientificcommunity and semiconductor marketplace. The photoacoustic effect is an astonishing accomplishment ofscience. It relies on incident light to cause local thermal excitations in a sample which then creates acoustic waves. Thistechnique has been advancing with the development of ultrafastspectroscopyin recentyears.

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