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New Methods for Assessing and Improving Safety

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New Methods for Assessing and Improving Safety

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To develop new methods of evaluation and safety improvements for integrated circuits concernning an imaging technique that uses a laser as a heat source to face the constant progress of test and integration technologies and the spread of attacks tools that are increasingly accessible. The TLS technique (Thermal Laser Stimulation) relies on the use of a laser beam focused on a target transistor, which generates a localized heat source. This rise in temperature leads to variations in electrical consumption of the order of a few teans of nA (nanoamps), the amplitude of which depends on the state of the transistor.

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