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Using a Power / Wavehead for Emitter Level Screening of High Power Laser Diode Bars

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Using a Power / Wavehead for Emitter Level Screening of High Power Laser Diode Bars

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  • Author: Lawrence A. Johnson, Andrew Shull
A simple technique has been described for measuring emitter-level optical power and wavelength in high power laser diode bars. The technique relies on the use of a scanned slit in conjunction with an ILX Lightwave OMM-6810B Optical Multimeter with OMH-6722B Power/Wavehead. This measurement technique can be used to identify defective emitters and anomalous stress that may lead to reduced reliability in laser diode bar assemblies.

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