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Quantum Metrology and Sensing

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Quantum Metrology and Sensing

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Quantum metrology and sensing, along with quantum-enhanced imaging (QMSI), leverage the unique properties of quantum states and phenomena such as entanglement and non-classical correlations across various physical platforms. These platforms include condensed matter, single photons, NV-centers, cold atoms, ions, and single electrons. QMSI devices offer significant improvements in the accuracy and precision of measurements across a wide array of systems. They overcome the limitations of traditional classical measurement techniques, addressing challenges such as environment-induced noise from vacuum fluctuations (shot noise), dynamically induced noise in position measurements (the standard quantum limit), and the diffraction limit.

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