1.  Home
  2. Whitepapers
  3. Newport XM Series Stage for High Speed Automated Optical Inspection (AOI) System

Newport XM Series Stage for High Speed Automated Optical Inspection (AOI) System

Download Whitepaper

Newport XM Series Stage for High Speed Automated Optical Inspection (AOI) System

Download Whitepaper
The semiconductor and microelectronics industries are continually evolving to meet the needs of advancing industrial and research applications. The push for miniaturization and expansion of capability continue to inspire new technologies for multi-layered fabrication processes. With the new development of processes and technology, Automated Optical Inspection (AOI) tools for early defect detection is becoming of critical importance for verification of prototype builds and high-volume production. AOI tools are currently used across technologies such as PCB, LCD, wire bonding, as well as wafer and photo-mask inspection.

Download Whitepaper Now