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Advanced Programmable Wavelength Markers For Swept Laser Based Test-Measurement Applications

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Advanced Programmable Wavelength Markers For Swept Laser Based Test-Measurement Applications

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External (or extended) cavity diode lasers (ECDL) have been widely used in many metrology and test-measurement applications including telecom components characterization, fiber sensing, phase-shift interferometry, lidar, and bio-medical sensing and imaging, etc. Among the commercially available tunable lasers in the market today for industry applications, New Focus TLM-8700 tunable laser module [1] (Photonics Circle of Excellence award in 2004), which is engined by voicecoil based tuning mechanism, offers the fastest mode-hop-free tuning speed (up to 2,000 nm/sec in standard version, and up to 20,000 nm/s for certain OEM applications) in a wide wavelength tuning range (e.g., 110 nm in 1520-1630 nm) .

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