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Near Field Imaging of a Laser Diode Using Scanning Method

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Near Field Imaging of a Laser Diode Using Scanning Method

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  • Author: Jay Jeong
This application note describes the result of an experiment performed on near field imaging of a laser diode emission pattern at the output facet. The purpose of the experiment was to provide a proof-of-concept system for the near field measurement of a high-power laser diode bar. The target resolution was approximately 1 um. The measurement setup was constructed on Newport AutoAlign8000 alignment system, which consists of two motion stage stacks and a stationary center post. Beam profiling was achieved by using a high magnification microscope objective and scanning a detector with a pinhole, as opposed to using a camera. Simple theoretical backgrounds to understand the near field imaging and measurement limitations are explained. The experiment was performed on a 980 nm laser diode output, using various optical systems. Based on the scanned profiles, the resolution limits of each optics was estimated.

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