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ReliaTest L/I Threshold Calculations

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ReliaTest L/I Threshold Calculations

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The LRS-9434 Laser Diode Reliability and Burn-In Test System is capable of generating L/I curves with up to a maximum of 500 points respectively. The ReliaTest software operates the LRS-9434 and manages the data from these L/I plots. ReliaTest calculates the threshold current from the L/I plots using four methods: Second Derivative, First Derivative, TwoSegment Fit, and Single-Line Line-Fit. The second derivative, first derivative, and two-segment fit algorithms are defined by the Generic Reliability Assurance Requirements for Optoelectronic Devices used in Telecommunications Equipment (Telcordia GR-468-CORE). Device temperature dependency (also described as characteristic temperature) and operating temperature stability could have a significant impact on threshold calculation accuracy and repeatability.

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