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Laser Diode Production Burn-in

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Laser Diode Production Burn-in

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High temperature burn-in screening is used in laser diode manufacturing to screen out devices that are likely to have unacceptably short lives and to ensure that the remaining population of lasers will have a statistically acceptable level of reliability. Laser diode reliability may be broadly defined as the ability to operate the device satisfactorily in a defined environment for a specified time. Many of the issues related to laser diode reliability are revealed by the hazard rate characteristic curve for a population of lasers, also known as a "Bath Tub Curve" (Figure 1). Hazard rate is defined as the probability of failure per unit time given that the device has survived until that time. The various hazard rates associated with laser diodes fall into three categories. First, infant mortality failures are caused by defects that were introduced during the manufacturing process or by intrinsic semiconductor defects. Second, external factors such as current surges and electrostatic discharge events create a constant hazard rate over the lifetime of a device. Finally, wear out failures in lasers occur that are usually caused by the growth of non-radiative, optically absorbing defects within the active region of the laser.

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