LRS-9434 and LMS-9406 Transient Protection

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Protection from harmful electrical transients is important in all applications of laser diodes due to the highly sensitive nature of these semiconductor devices. This is particularly true in life-test and burn-in applications where data integrity and production cost may be impacted. During life-test of laser diodes, thousands of hours of data are collected in order to calculate the life times of the devices. Any damage or loss of devices caused by the test system or an external power line transient can result in erroneous data or loss of thousands of hours of test time. During production burnin, any loss of devices due to the burn-in test system reduces yield and increases the overall cost of test. Fortunately, with careful design it is possible to eliminate these risks.