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GoPhotonics features a wide range of SWIR Sensors designed for high-performance short-wave infrared imaging across industrial, scientific, and machine vision applications. Utilizing advanced InGaAs and SWIR imaging technologies, these sensors deliver high-resolution image capture, excellent sensitivity, low-noise performance, and reliable operation for imaging beyond the visible spectrum. They support applications including material sorting, non-destructive inspection, hyperspectral imaging, optical metrology, semiconductor inspection, scientific imaging, radiation thermometry, counterfeit detection, additive manufacturing, welding, laser communication, and water visualization.
Available in both area scan and linear scan configurations, these SWIR sensors incorporate features such as global shutter operation, CMOS and ROIC-based readout architectures, multiple readout modes, thermoelectric cooling, and flexible output interfaces for seamless integration into a wide range of imaging systems. Their robust designs make them well suited for industrial automation, spectroscopy, medical and biological research, machine vision, electro-optical systems, astronomy, fiber-optic telecommunications, and other applications requiring accurate and dependable short-wave infrared imaging.
IMX992 - SWIR Sensors for Material Sorting Applications
The IMX992 from RESTAR FRAMOS Technologies (SONY) is a 5.32 megapixel SWIR image sensor with an effective resolution of 2592 (H) x 2056 (V) pixels, enabling detailed image capture for short-wave infrared imaging applications. Its global shutter architecture ensures distortion-free imaging of fast-moving objects, making it suitable for high-speed inspection and machine vision tasks. The sensor supports both SLVS and MIPI output interfaces, allowing seamless integration into a wide range of imaging systems. It is designed for applications including material sorting, water visualization, transmission observation, and thermal observation, where reliable SWIR imaging is essential.
G11620-512SA - InGaAs SWIR Sensor for Non-Destructive Inspection Applications
The G11620-512SA from Hamamatsu Photonics is an InGaAs linear SWIR sensor with a spectral response range of 0.95 µm - 1.67 µm, an effective resolution of 512 pixels, and a peak sensitivity wavelength of 1.55 µm. Its single-chip CMOS readout architecture integrates charge amplifiers, a shift register, and a timing generator onto a single chip using bump-bonding technology, enabling efficient signal processing and compact system design. The sensor incorporates a built-in saturation countermeasure circuit, CDS circuit, thermoelectric cooling, and an anti-reflective sapphire window to enhance imaging stability and signal quality. It is well suited for near-infrared multichannel spectrophotometry, radiation thermometry, and non-destructive inspection applications requiring accurate SWIR detection.
NSC2001 - InGaAs Triple H SWIR Sensor for Optical Metrology & Welding Applications
The NSC2001 from New Imaging Technologies is an InGaAs Triple H SWIR sensor with a resolution of 320 (H) x 256 (V) pixels, designed for high-speed short-wave infrared imaging. Its dual linear and logarithmic operating modes enable imaging across a wide range of light intensities, while high frame rate performance supports the capture of fast-changing events. The sensor is well suited for optical metrology and testing, additive manufacturing, welding, and laser communication applications that require accurate, high-speed SWIR imaging.
ISC1202 SWIR - InGaAs SWIR Sensor for Counterfeit Detection Applications
The ISC1202 SWIR from Teledyne FLIR is an InGaAs SWIR sensor with a spectral range of 0.9 µm - 1.7 µm and a resolution of 640 (H) x 512 (V) pixels, enabling high-quality short-wave infrared imaging for a wide range of inspection and imaging tasks. It delivers high quantum efficiency, excellent pixel operability, and full optical fill factor for reliable image capture, while supporting high-speed imaging with flexible exposure control. The sensor incorporates an advanced read-out integrated circuit (ROIC) with on-chip correlated double sampling (CDS), multiple gain modes, thermoelectric cooling, and built-in ESD protection to improve image quality, reduce noise, and ensure stable operation. It is well suited for hyperspectral instrumentation, silicon inspection, electro-optical payloads, art restoration, portable imaging systems, and counterfeit detection applications.
FPA0640P15F-17-T2 - InGaAs SWIR Image Sensor for Scientific Applications
The FPA0640P15F-17-T2 from Chunghwa Leading Photonics Tech (CLPT) is an InGaAs SWIR image sensor with a spectral range of 0.9 µm - 1.7 µm and an effective resolution of 636 (H) x 508 (V) pixels, providing high-quality short-wave infrared imaging for scientific and industrial applications. Based on planar InGaAs PIN sensor technology, it offers high quantum efficiency, excellent pixel operability, low noise performance, and high sensitivity for accurate image acquisition. The sensor supports multiple output configurations and readout modes, enabling flexible integration into a variety of imaging systems. It also incorporates a built-in temperature sensor and 2-stage thermoelectric cooling to maintain stable imaging performance. The sensor is well suited for near-infrared imaging, covert surveillance, semiconductor and solar panel inspection, medical and biological research, fiber-optic telecommunications, ice, slush, and moisture mapping, industrial thermal imaging, fog and smoke imaging, astronomy, and other scientific applications.
With their ability to deliver high sensitivity imaging, stable short-wave infrared detection, and accurate visualization beyond the visible spectrum, SWIR sensors featured on GoPhotonics address the growing demand for advanced imaging solutions in industrial, scientific, and inspection systems. By enabling reliable material differentiation, high-speed imaging, and precise defect detection, these sensors play a critical role in material sorting, non-destructive testing, semiconductor inspection, hyperspectral imaging, machine vision, optical metrology, surveillance, scientific research, and advanced manufacturing applications.
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