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GoPhotonics presents a comprehensive portfolio of high-performance SWIR (Short-Wave Infrared) sensors from leading global manufacturers, delivering exceptional sensitivity and accuracy for applications such as material sorting, hyperspectral imaging, semiconductor inspection, scientific research, defense, and industrial monitoring. Designed for versatility across laboratory, field, and production environments, these sensors provide high quantum efficiency, low noise operation, and fast response times, thereby ensuring precise and reliable imaging even in challenging low-light and high-contrast conditions.

The curated range spans InGaAs and hybrid CMOS-InGaAs sensors in linear and 2D array formats, with options for extended wavelength detection, high frame rates, and advanced pixel architectures. Available in compact, rugged, and thermoelectrically cooled packages, these SWIR sensors integrate seamlessly into optical inspection systems, portable instruments, hyperspectral cameras, and defense-grade imaging platforms, enabling next-generation performance in short-wave infrared detection and imaging applications.

IMX992 - SWIR Sensors for Material Sorting Applications

The IMX992 from Sony Semiconductor Solutions Corporation is a 5.32 MP SWIR sensor optimized for high-speed, high-accuracy imaging in industrial and scientific systems. It features a global shutter in a 1/1.4" optical format, ensuring distortion-free capture even in dynamic environments, while its 3.45 μm pixel structure delivers detailed resolution with excellent sensitivity. Offering frame rates of up to 131 fps depending on ADC configuration, the sensor balances speed with precision for demanding inspection and monitoring tasks. With a quantum efficiency greater than 75% and operability above 99.5%, it provides consistent performance across varied conditions. The IMX992 also incorporates an optical black region to support image calibration and enhance accuracy. It supports multiple high-speed interfaces, including SLVS and MIPI outputs, enabling flexible integration into diverse system architectures. Available in standard and thermoelectrically cooled package options, this sensor is ideally suited for material sorting, water and moisture visualization, transmission observation, and temperature-related monitoring, where stable and accurate SWIR imaging is critical.

FPA0640P15F-17-T2 - InGaAs SWIR Image Sensor for Scientific Applications

The FPA0640P15F-17-T2 from Chunghwa Leading Photonics Tech (CLPT) is an InGaAs SWIR image sensor designed for high-precision scientific and industrial applications. Covering a spectral range of 0.9 - 1.7 µm, it delivers a quantum efficiency above 70%, ensuring strong sensitivity across the short-wave infrared band. The sensor features a 636 x 508 pixel array with a 15 µm pitch and maintains pixel operability above 99.9%, providing reliable imaging performance. Built on planar InGaAs PIN technology, it combines low dark current with a readout noise floor below 35 e-, supporting accurate signal capture under low-light conditions. It offers multiple gain settings to balance sensitivity and charge capacity, while flexible readout modes (snapshot ITR/IWR and IMRO) and multi-output options with pixel rates up to 18 MHz enable adaptable system integration. Equipped with a built-in temperature sensor and a two-stage thermoelectric cooler, the FPA0640P15F-17-T2 ensures stable operation. Available in a 28-pin metal SDIP package, it is ideal for near-infrared imaging, semiconductor and solar panel inspection, medical and biological research, fiber-optic telecommunication, covert surveillance, astronomy, ice and moisture mapping, industrial thermal imaging, and see-through imaging in fog or smoke.

G16562-0808T - InGaAs SWIR Sensor for NIR Non-Destructive Inspection

The G16562-0808T from Hamamatsu Photonics is an InGaAs SWIR sensor designed for non-destructive inspection in the near-infrared range. Covering a spectral range of 1.12 - 1.85 µm, it provides a resolution of 320 x 256 pixels with a 20 µm pitch, delivering clear and reliable imaging for precision applications. The sensor achieves a quantum efficiency fill factor of 100% and peak sensitivity at 1.75 µm, with photosensitivity of 0.9 A/W, ensuring strong detection across its operating band. With frame rates up to 503 fps, it supports high-speed imaging while maintaining accuracy through low defective pixel rates. Built on a hybrid structure that combines a CMOS readout circuit with back-illuminated InGaAs photodiodes, it delivers stable performance with low noise, wide dynamic range, and consistent photoresponse. The sensor integrates a three-stage thermoelectric cooler and an anti-reflective coated sapphire glass window, supporting long-term reliability in demanding environments. Housed in a hermetically sealed 28-pin metal package, the G16562-0808T is ideally suited for hyperspectral imaging, near-infrared non-destructive inspection, and traffic monitoring applications.

ISC1202 SWIR - InGaAs SWIR Sensor for Counterfeit Detection Applications

The ISC1202 SWIR from Teledyne FLIR is an InGaAs short-wave infrared sensor developed for high-precision imaging in applications such as counterfeit detection, hyperspectral instrumentation, silicon inspection, and electro-optical payloads. Covering a spectral range of 0.9 - 1.7 µm, it offers a resolution of 640 x 512 pixels with a 15 µm pitch and an active area of 9.6 x 7.68 mm, ensuring detailed and accurate imaging. With quantum efficiency above 65% between 1 - 1.5 µm, an optical fill factor of 100%, and operability greater than 99.5%, the sensor delivers reliable sensitivity and consistent performance. It supports exposure times from 1 µs to full frame with a maximum refresh rate of 240 Hz, enabling flexible use from fast imaging to longer integrations. The ISC1202 SWIR integrates an on-chip correlated double sampling circuit for noise reduction, offers three gain-state operating modes, and achieves a readout noise as low as 35 e-, enhancing image clarity. Designed with a thermoelectric cooler for stable operation and built-in ESD protection, it is housed in a hermetically sealed 36-pin package, making it suitable for portable systems, industrial inspection, art restoration, and advanced scientific imaging. 

FPA-640x512-TE2 - InGaAs/InP SWIR Sensor for Spectroscopy Applications

The FPA-640x512-TE2 from ANDANTA is an InGaAs/InP SWIR sensor with a spectral response range of 0.9 - 1.7 µm, a resolution of 640 x 512 pixels, a pixel size of 25 x 25 µm, an image area of 16 x 12.8 mm, quantum efficiency greater than 70%, and a fill factor over 99%. These characteristics ensure high-sensitivity, low-noise imaging with precise pixel performance. The sensor is designed to minimize pixel crosstalk and maximize detectivity, providing clear and accurate images across a wide range of near-infrared applications. Its high pixel operability and fast readout make it suitable for imaging spectroscopy, covert surveillance, semiconductor inspection, medical and biological research, fiber-optic monitoring, astronomy, industrial thermal imaging, and moisture mapping.

With its versatile SWIR sensor portfolio, GoPhotonics provides engineers, researchers, and system designers with reliable short-wave infrared imaging solutions for applications ranging from material sorting and hyperspectral imaging to scientific research and industrial inspection. The selection features sensors with broad spectral sensitivity, high quantum efficiency, low noise, and excellent operability, enabling accurate and stable infrared detection across diverse optical systems. Designed for both compact and high-performance imaging setups, these SWIR sensors deliver consistent performance and long-term reliability, making them ideal for advanced photonics, industrial, and scientific applications.