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GoPhotonics presents a comprehensive portfolio of SWIR sensors engineered for high-sensitivity imaging and detection across the short-wave infrared spectral region. Designed to support applications ranging from non-destructive inspection and material sorting to optical metrology, spectroscopy, and scientific research, this lineup includes linear and area-array InGaAs and InGaAs/InP sensor technologies. Covering a range of resolutions, readout architectures, and imaging formats, these SWIR sensors enable enhanced contrast, deeper material penetration, and reliable detection of features that are not visible in the standard visible or near-infrared bands.
With performance attributes such as high quantum efficiency, low noise operation, wide dynamic range, fast readout capability, and high pixel operability, these sensors are built for accurate and repeatable measurements in demanding environments. Support for high-speed imaging, global shutter operation, flexible readout modes, and integration-ready digital interfaces makes them suitable for laboratory research, industrial process monitoring, machine vision, and OEM system development. GoPhotonics’ SWIR sensor portfolio enables precise imaging and measurement for applications including spectroscopy, semiconductor and photovoltaic inspection, additive manufacturing and welding monitoring, moisture and transmission analysis, medical and biological imaging, astronomy, and advanced industrial inspection workflows.
G11620-512SA - InGaAs SWIR Sensor for Non-Destructive Inspection
The G11620-512SA from Hamamatsu Photonics is an InGaAs linear SWIR sensor developed for non-destructive inspection and near-infrared measurement, with spectral sensitivity spanning 0.95 µm - 1.67 µm and peak response around 1.55 µm. Its specifications indicate a 512-pixel linear imaging format optimized for one-dimensional detection, delivering high photosensitivity, wide dynamic range, and low readout noise suitable for precise intensity measurements at short integration times. The use of a single-chip CMOS readout architecture with integrated charge amplification, timing, and signal processing reflects stable and efficient signal handling with uniform response across pixels. High-speed readout capability supports rapid data acquisition for scanning and spectroscopic systems, while built-in noise suppression and saturation countermeasures enhance measurement reliability. Overall, these characteristics define a SWIR sensor platform well-suited for near-infrared multichannel spectrophotometry, radiation thermometry, and non-destructive inspection applications requiring accurate, fast, and stable SWIR detection.
NSC2001 - InGaAs Triple H SWIR Sensor for Optical Metrology & Welding Applications
The NSC2001 from New Imaging Technologies is an InGaAs SWIR image sensor designed for high-speed and high-dynamic-range imaging in optical metrology and industrial monitoring. Its specifications indicate a two-dimensional imaging format with low noise performance and support for both linear and logarithmic response modes, enabling accurate capture of scenes with extreme intensity variations. The ability to operate at very high frame rates, with additional speed available through region-of-interest readout, reflects suitability for fast, transient processes. The combination of wide dynamic range and rapid imaging performance positions this sensor for applications such as optical metrology and testing, additive manufacturing process monitoring, welding observation, and laser communication systems where both speed and intensity discrimination are critical.
IMX992 - SWIR Sensors for Material Sorting Applications
The IMX992 from RESTAR FRAMOS Technologies is a high-resolution SWIR image sensor platform developed for material sorting and industrial imaging applications. Its specifications indicate a multi-megapixel imaging format with a global shutter, enabling distortion-free capture of fast-moving scenes at high frame rates with flexible bit-depth readout. High quantum efficiency and excellent pixel operability reflect strong sensitivity and uniform image quality across the sensor array, supporting reliable detection of subtle contrast differences in SWIR imaging. The inclusion of optical black reference regions supports stable signal calibration, while support for high-speed digital output interfaces indicates straightforward integration into modern machine vision systems. Overall, these characteristics position the IMX992 sensors for applications such as material sorting, moisture and water visualization, transmission-based inspection, and observation tasks where high resolution, speed, and SWIR sensitivity are essential.
FPA0640P15F-17-T2 - InGaAs SWIR Image Sensor for Scientific Applications
The FPA0640P15F-17-T2 from Chunghwa Leading Photonics Tech is an InGaAs SWIR image sensor intended for scientific and analytical imaging, with spectral sensitivity spanning 0.9 µm - 1.7 µm and high quantum efficiency across the near-infrared band. Its specifications indicate a mid-resolution two-dimensional imaging format with very high pixel operability, flexible gain settings, and large charge handling capability, enabling accurate signal capture across a wide range of illumination levels. The use of planar InGaAs PIN technology, combined with low dark signal and low readout noise, reflects strong sensitivity and reliable detection of weak optical signals. Multi-output readout and high pixel-rate capability support fast image acquisition and multiple readout modes for different measurement scenarios. Overall, these characteristics define a SWIR sensor platform well-suited for near-infrared imaging, scientific research, semiconductor and photovoltaic inspection, medical and biological analysis, industrial monitoring, environmental imaging, astronomy, and applications requiring high-sensitivity SWIR detection.
FPA-640x512-TE2 - InGaAs/InP SWIR Sensor for Spectroscopy Applications
The FPA-640x512-TE2 from ANDANTA is an InGaAs/InP SWIR image sensor developed for spectroscopy and near-infrared imaging, with spectral sensitivity spanning 0.9 µm - 1.7 µm. Its specifications indicate a two-dimensional imaging array with high quantum efficiency, excellent pixel operability, and very high fill factor, supporting accurate and uniform signal capture across the SWIR band. Low dark signal, minimal pixel crosstalk, and high detectivity reflect strong sensitivity to weak optical signals and clean image formation, while controlled response nonuniformity and low nonlinearity support quantitative measurements. The availability of multiple gain modes and high-speed pixel readout indicates flexibility for both low-light detection and higher signal scenarios. Overall, these characteristics define a SWIR sensor platform suited for imaging spectroscopy, scientific research, semiconductor inspection, medical and biological imaging, fiber-optic communication monitoring, astronomy, industrial thermal imaging, covert observation, and moisture mapping applications where precision and reliability are critical.
With its broad portfolio of high-performance SWIR sensors, GoPhotonics highlights imaging and detection solutions engineered for accurate, repeatable, and high-contrast observation across the short-wave infrared spectral region. By combining high quantum efficiency, low noise performance, wide dynamic range, and fast readout architectures, these sensors deliver the sensitivity and reliability required for material discrimination, low-light imaging, and precise spectral analysis. GoPhotonics’ focus on performance-driven engineering and application-oriented design positions its SWIR sensor portfolio as a trusted foundation for non-destructive inspection, spectroscopy, optical metrology, industrial process monitoring, scientific research, and advanced imaging applications across demanding photonics environments.
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